Banner photo captions: View of Engineering Hall and Maquina fountain from the north.

Woollam V-VASE ellipsometer Woollam V-VASE ellipsometer
J.A.Woollam V-VASE ellipsometer is a wide spectral range (UV-Vis-NIR) variable angle spectroscopic research-grade ellipsometer that allows various measurement capabilities including reflection and transmission ellipsometry, generalized ellipsometry of anisotropic materials, UV-Vis-NIR reflection and transmission spectroscopy, Mueller matrix measurements. Additional AutoRetarder optics eliminates poor sensitivity for specific Delta and Psi values.

Characteristics

Optical configuration: RAE (rotating analyzer ellipsometer) with AutoRetarder
Spectral range: 190 - 2500 nm
Angles of incidence: 15° - 90°
Max sample size: 200 mm x 200 mm, 20 mm thickness
Sample plane: vertical
Data acquisition rate: 0.1 - 3 s per wavelength
Accessory: HTC-100 heat stage, room temperature - 300 °C, 70° angle of incidence, passive cooling, 50 mm sample size